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Published: Kem. Ind. 71 (1-2) (2022) 29–38
Paper reference number: KUI-20/2021
Paper type: Original scientific paper
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Growth Modelling of Saccharomyces cerevisiae and Simulation of Pyrite Ash X-ray Diffraction Patterns

Y. Ermurat


Saccharomyces cerevisiae was incubated in media comprising pyrite ash for growth modelling studies, and the samples of pyrite ash were analysed using X-ray diffraction (XRD) to simulate profiles. The sigmoidal modelling curves in 3D growth graphs were presented alongside numerical error computations and graphs. Simulation of XRD spectra of the pyrite ash using diffraction profiling functions were conducted for designing a combined experimental process. The von Bertalanffy growth model function yielded the lowest relative error value of 11.56 %, and the exponential model estimation produced the low numerical error percentages as Euler’s error of 4.8 %, and Heun’s error of 5.36 %. Gaussian and Lorentzian approximations were applied to shape the data of the XRD profiles of sulphur-containing samples, and well-described graph simulations were obtained using the Gaussian estimation.

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Saccharomyces cerevisiae, pyrite ash, growth modelling, error analysis, XRD analysis